| /** @file | |
| Implementation of TestAndClearBit using compare-exchange primitive | |
| Copyright (C) 2015, Linaro Ltd. | |
| Copyright (c) 2015, Intel Corporation. All rights reserved.<BR> | |
| SPDX-License-Identifier: BSD-2-Clause-Patent | |
| **/ | |
| #include <Base.h> | |
| #include <Library/SynchronizationLib.h> | |
| INT32 | |
| EFIAPI | |
| TestAndClearBit ( | |
| IN INT32 Bit, | |
| IN VOID *Address | |
| ) | |
| { | |
| UINT16 Word, Read; | |
| UINT16 Mask; | |
| // | |
| // Calculate the effective address relative to 'Address' based on the | |
| // higher order bits of 'Bit'. Use signed shift instead of division to | |
| // ensure we round towards -Inf, and end up with a positive shift in | |
| // 'Bit', even if 'Bit' itself is negative. | |
| // | |
| Address = (VOID *)((UINT8 *)Address + ((Bit >> 4) * sizeof (UINT16))); | |
| Mask = 1U << (Bit & 15); | |
| for (Word = *(UINT16 *)Address; Word &Mask; Word = Read) { | |
| Read = InterlockedCompareExchange16 (Address, Word, Word & ~Mask); | |
| if (Read == Word) { | |
| return 1; | |
| } | |
| } | |
| return 0; | |
| } |